Introduction

The program consists of three main components, these are: 1. SiC crystal edge detection AlgorithmSystem1.CreateResultImage 2. Analysis of wave and spline patterns in epilayers AlgorithmSystem2.CreateResultImage 3. Structure analysis of remaining raw SiC AlgorithmSystem3.CalculateHeightmap

Input

These are used individually and all take different kinds of input: 1. Takes an image of the crystalized raw SiC 2. Takes an image of the grown epilayes scanned with an electron microscope 3a. Takes a folder of focus images to create a height map from 3b. Takes a height map to generate a landscape from

Output

The output of the subsystems are as follows: 1. A segmented image containing the boarders of the grains and/or statistical properties for this image 2. An image containging the detected wave patterns and/or statistical properties for the image 3a. A height map generated from the focus images 3b. No output, but generates a landscape